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1

[IEEE 2020 9th Mediterranean Conference on Embedded Computing (MECO) - Budva, Montenegro (2020.6.8-2020.6.11)] 2020 9th Mediterranean Conference on Embedded Computing (MECO) - An Electromagnetic Energy Harvester and Power Management in 28-nm FDSOI for IoT

Sedighiani, Shima, Singh, Kamlesh, Huisken, Jos, Jordans, Roel, Harpe, Pieter, de Gyvez, Jose Pineda

Year:

2020

File:

PDF, 3.20 MB

2020

2

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - An SRAM weak cell fault model and a DFT technique with a programmable detection threshold

Pavlov, A., Sachdev, M., Pineda de Gyvez, J.

Year:

2004

Language:

english

File:

PDF, 692 KB

english, 2004

3

[IEEE 2012 IEEE Subthreshold Microelectronics Conference (SubVT) - Waltham, MA, USA (2012.10.9-2012.10.10)] 2012 IEEE Subthreshold Microelectronics Conference (SubVT) - Library tuning for subthreshold operation

Liu, Bo, de Gyvez, Jose Pineda, Ashouei, Maryam

Year:

2012

Language:

english

File:

PDF, 512 KB

english, 2012

4

[IEEE ISCAS '98 1998 IEEE International Symposium on Circuits and Systems - Monterey, CA, USA (31 May-3 June 1998)] ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187) - Programmable low noise amplifier with active-inductor load

Zhuo, W., de Gyvez, J.P., Sanchez-Sinencio, E.

Year:

1998

Language:

english

File:

PDF, 363 KB

english, 1998

5

Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits

Pineda de Gyvez, J., Tuinhout, H.P.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2004

Language:

english

File:

PDF, 649 KB

english, 2004

6

[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - A forward body bias generator for digital CMOS circuits with supply voltage scaling

Meijer, Maurice, de Gyvez, Jose Pineda, Kup, Ben, van Uden, Bert, Bastiaansen, Peter, Lammers, Marco, Vertregt, Maarten

Year:

2010

Language:

english

File:

PDF, 736 KB

english, 2010

7

Digital Systems Power Management for High Performance Mixed Signal Platforms

Kapoor, Ajay, Groot, Cas, Pique, Gerard Villar, Fatemi, Hamed, Echeverri, Juan, Sevat, Leo, Vertregt, Maarten, Meijer, Maurice, Sharma, Vibhu, Pu, Yu, de Gyvez, Jose Pineda

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2014

Language:

english

File:

PDF, 4.13 MB

english, 2014

8

Color image processing in a cellular neural-network environment

Chi-Chien Lee,, de Gyvez, J.P.

Journal:

IEEE Transactions on Neural Networks

Year:

1996

Language:

english

File:

PDF, 2.23 MB

english, 1996

9

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Word line pulsing technique for stability fault detection in sram cells

Pavlov, A., Azimane, M., Pineda de Gyvez, J., Sachdev, M.

Year:

2005

Language:

english

File:

PDF, 792 KB

english, 2005

10

[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - Limits to Performance Spread Tuning using Adaptive Voltage and Body Biasing

Meijer, M., Pessolano, F., Pineda de Gyvez, J.

Year:

2005

Language:

english

File:

PDF, 409 KB

english, 2005

11

Resistance characterization for weak open defects

Montanes, R.R., de Gyvez, J.P., Volf, P.

Journal:

IEEE Design & Test of Computers

Year:

2002

Language:

english

File:

PDF, 437 KB

english, 2002

12

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Calibration and Debugging of Multi-step Analog to Digital Converters

Zjajo, Amir, Gyvez, Jose Pineda de

Year:

2008

Language:

english

File:

PDF, 3.33 MB

english, 2008

13

Analog fault diagnosis based on ramping power supply current signature clusters

Somayajula, S.A.S., Sanchez-Sinencio, E., Pineda de Gyvez, J.

Journal:

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing

Year:

1996

Language:

english

File:

PDF, 1.05 MB

english, 1996

14

Efficient testing and diagnosis of faulty power switches in SOCs

Goel, S.K., Meijer, M., de Gyvez, J. Pineda

Journal:

IET Computers & Digital Techniques

Year:

2007

Language:

english

File:

PDF, 539 KB

english, 2007

15

[ACM Press the 2004 international symposium - Newport Beach, California, USA (2004.08.09-2004.08.11)] Proceedings of the 2004 international symposium on Low power electronics and design - ISLPED '04 - Technology exploration for adaptive power and frequency scaling in 90nm CMOS

Meijer, Maurice, Pessolano, Francesco, de Gyvez, Jose Pineda

Year:

2004

Language:

english

File:

PDF, 755 KB

english, 2004

16

[ACM Press the 49th Annual Design Automation Conference - San Francisco, California (2012.06.03-2012.06.07)] Proceedings of the 49th Annual Design Automation Conference on - DAC '12 - Standard cell sizing for subthreshold operation

Liu, Bo, Ashouei, Maryam, Huisken, Jos, De Gyvez, Jose Pineda

Year:

2012

Language:

english

File:

PDF, 907 KB

english, 2012

17

[IEEE 2016 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2016.6.15-2016.6.17)] 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) - A microcontroller with 96% power-conversion efficiency using stacked voltage domains

Blutman, Kristof, Kapoor, Ajay, Majumdar, Arjun, Martinez, Jacinto Garcia, Echeverri, Juan, Sevat, Leo, van der Wel, Arnoud, Fatemi, Hamed, de Gyvez, Jose Pineda, Makinwa, Kofi

Year:

2016

Language:

english

File:

PDF, 571 KB

english, 2016

18

Using capacitive cross-coupling technique in RF low noise amplifiers and down-conversion mixer design

Zhuo, Wei Zhuo Wei, Embabi, S., Gyvez, J.P. De, Sanchez-Sinencio, E.

Journal:

Information Technology Interfaces, 2004. 26th International Conference on

Year:

2000

Language:

english

File:

PDF, 118 KB

english, 2000

19

A Low-Power Microcontroller in a 40-nm CMOS Using Charge Recycling

Blutman, Kristof, Kapoor, Ajay, Majumdar, Arjun, Martinez, Jacinto Garcia, Echeverri, Juan, Sevat, Leo, van der Wel, Arnoud P., Fatemi, Hamed, Makinwa, Kofi A. A., de Gyvez, Jose Pineda

Journal:

IEEE Journal of Solid-State Circuits

Year:

2017

Language:

english

File:

PDF, 4.68 MB

english, 2017

20

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Multi-Bit Pulsed-Latch Based Low Power Synchronous Circuit Design

Singh, Kamlesh, Rosas, Omar Alejandro Rodriguez, Jiao, Hailong, Huisken, Jos, de Gyvez, Jose Pineda

Year:

2018

Language:

english

File:

PDF, 280 KB

english, 2018

21

Sub-Threshold Standard Cell Sizing Methodology and Library Comparison

Liu, Bo, de Gyvez, Jose, Ashouei, Maryam

Journal:

Journal of Low Power Electronics and Applications

Year:

2013

Language:

english

File:

PDF, 453 KB

english, 2013

22

[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Trading Digital Accuracy for Power in an RSSI Computation of a Sensor Network Transceiver

Detterer, Paul, Erdin, Cumhur, Nabi, Majid, de Gyvez, Jose Pineda, Basten, Twan, Jiao, Hailong

Year:

2019

Language:

english

File:

PDF, 377 KB

english, 2019

23

Subband coding and image compression using CNN

Moreira-Tamayo, Oscar, Pineda De Gyvez, José

Journal:

International Journal of Circuit Theory and Applications

Year:

1999

Language:

english

File:

PDF, 431 KB

english, 1999

24

Time-Multiplexing Scheme for Cellular Neural Networks Based Image Processing

Apollo Q. Fong, Ajay Kanji, Jose Pineda de Gyvez

Journal:

Real-Time Imaging

Year:

1996

Language:

english

File:

PDF, 401 KB

english, 1996

25

Multi-VDD Testing for Analog Circuits

José Pineda de Gyvez, Guido Gronthoud, Rachid Amine

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 2.07 MB

english, 2005

26

Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

Amir Zjajo, Jose Pineda de Gyvez, Guido Gronthoud

Journal:

Journal of Electronic Testing

Year:

2006

Language:

english

File:

PDF, 439 KB

english, 2006

27

Parametric fault identification and dynamic compensation techniques for cellular neural network hardware

Grimaila, M.R., Pineda de Gyvez, J.

Journal:

IEE Proceedings - Circuits Devices and Systems

Year:

1996

Language:

english

File:

PDF, 1.29 MB

english, 1996

28

Course development in IC manufacturing

Pineda de Gyvez, J.

Journal:

IEEE Transactions on Education

Year:

1994

Language:

english

File:

PDF, 1006 KB

english, 1994

29

Analog system-level fault diagnosis based on a symbolic method in the frequency domain

Zhihong You, Sanchez-Sinencio, E., Pineda de Gyvez, J.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

1995

Language:

english

File:

PDF, 813 KB

english, 1995

30

Full-signature real-time corrosion detection of underground casing pipes

Jiming Yin, Mi Lu, Pineda de Gyvez, J.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2000

Language:

english

File:

PDF, 230 KB

english, 2000

31

Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS

Zjajo, A., Barragan, M.J., de Gyvez, J.P.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2012

Language:

english

File:

PDF, 1.00 MB

english, 2012

32

Weak Cell Detection in Deep-Submicron SRAMs: A Programmable Detection Technique

Pavlov, A., Sachdev, M., Jose Pineda de Gyvez

Journal:

IEEE Journal of Solid-State Circuits

Year:

2006

Language:

english

File:

PDF, 1.04 MB

english, 2006

33

An Ultra-Low-Energy Multi-Standard JPEG Co-Processor in 65 nm CMOS With Sub/Near Threshold Supply Voltage

Yu Pu, Pineda de Gyvez, J., Corporaal, H., Yajun Ha

Journal:

IEEE Journal of Solid-State Circuits

Year:

2010

Language:

english

File:

PDF, 3.26 MB

english, 2010

34

Introduction to the Special Issue on the 36th European Solid-State Circuits Conference (ESSCIRC)

Rodríguez-Vázquez, A., Leenaerts, D. M. W., Pineda de Gyvez, J.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2011

Language:

english

File:

PDF, 644 KB

english, 2011

35

A capacitor cross-coupled common-gate low-noise amplifier

Zhuo, W., Li, X., Shekhar, S., Embabi, S.H.K., de Gyvez, J.P., Allstot, D.J., Sanchez-Sinencio, E.

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2005

Language:

english

File:

PDF, 557 KB

english, 2005

36

A four-quadrant S2I switched-current multiplier

Manganaro, G., De Gyvez, J.P.

Journal:

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing

Year:

1998

Language:

english

File:

PDF, 277 KB

english, 1998

37

Analog computation of wavelet transform coefficients in real-time

Moreira-Tamayo, O., Pineda de Gyvez, J.

Journal:

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications

Year:

1997

Language:

english

File:

PDF, 149 KB

english, 1997

38

IC defect sensitivity for footprint-type spot defects

Pineda de Gyvez, J., Di, C.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

1992

Language:

english

File:

PDF, 2.14 MB

english, 1992

39

On the design and implementation of a wafer yield editor

de Gyvez, J.P., Jess, J.A.G.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

1989

Language:

english

File:

PDF, 696 KB

english, 1989

40

Built-in current sensor for ΔIDDQ testing

Vazquez, J.R., Pineda de Gyvez, J.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2004

Language:

english

File:

PDF, 484 KB

english, 2004

41

[IEEE 2012 IEEE 25th International SOC Conference (SOCC) - Niagara Falls, NY, USA (2012.09.12-2012.09.14)] 2012 IEEE International SOC Conference - A better-than-worst-case circuit design methodology using timing-error speculation and frequency adaptation

Londono, Sebastian Moreno, de Gyvez, Jose Pineda

Year:

2012

Language:

english

File:

PDF, 574 KB

english, 2012

42

Architectural Analysis for Wirelessly Powered Computing Platforms

Kapoor, Ajay, de Gyvez, Jose Pineda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2013

Language:

english

File:

PDF, 1.04 MB

english, 2013

43

Low-Power High-Resolution Analog to Digital Converters ||

Zjajo, Amir, Pineda de Gyvez, José

Year:

2011

Language:

english

File:

PDF, 7.61 MB

english, 2011

44

[IEEE 2009 IEEE International Solid-State Circuits Conference (ISSCC 2009) - San Francisco, CA (2009.02.8-2009.02.12)] 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - An ultra-low-energy/frame multi-standard JPEG co-processor in 65nm CMOS with sub/near-threshold power supply

Yu Pu,, de Gyvez, J.P., Corporaal, H., Yajun Ha,

Year:

2009

Language:

english

File:

PDF, 1.17 MB

english, 2009

45

[IEEE Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings - Brussels, Belgium (4-6 June 1996)] Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings - Real-time full signature corrosion detection of underground casing pipes

Jiming Yin,, Pineda de Gyvez, J., Mi Lu,

Year:

1996

Language:

english

File:

PDF, 757 KB

english, 1996

46

Body-Bias-Driven Design Strategy for Area- and Performance-Efficient CMOS Circuits

M. Meijer, J. Pineda De Gyvez

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2012

Language:

english

File:

PDF, 882 KB

english, 2012

47

[IEEE 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009) - Yasmine Hammamet, Tunisia (2009.12.13-2009.12.16)] 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009) - Dynamic voltage scaling based on supply current tracking using fuzzy Logic controller

Pourshaghaghi, Hamid Reza, de Gyvez, Jose Pineda

Year:

2009

Language:

english

File:

PDF, 323 KB

english, 2009

48

[IEEE Comput. Soc. Press [1989] 1st European Test Conference - Paris, France (12-14 April 1989)] [1989] Proceedings of the 1st European Test Conference - On the definition of critical areas for IC photolithographic spot defects

Pineda de Gyvez, J., Jess, J.A.G.

Year:

1989

Language:

english

File:

PDF, 598 KB

english, 1989

49

[IEEE 2010 International Conference on Energy Aware Computing (ICEAC) - Cairo, Egypt (2010.12.16-2010.12.18)] 2010 International Conference on Energy Aware Computing - Extending Amdahl's law for energy-efficiency

Londono, Sebastian Moreno, de Gyvez, Jose Pineda

Year:

2010

Language:

english

File:

PDF, 829 KB

english, 2010

50

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Logic synthesis of low-power ICs with ultra-wide voltage and frequency scaling

Pu, Yu, Echeverri, Juan, Meijer, Maurice, Gyvez, Jose Pineda de

Year:

2014

Language:

english

File:

PDF, 144 KB

english, 2014